发明申请
- 专利标题: Fail judging method and analyzer
- 专利标题(中): 故障判断方法和分析仪
-
申请号: US10496041申请日: 2002-11-18
-
公开(公告)号: US20050067301A1公开(公告)日: 2005-03-31
- 发明人: Yoshimitsu Morita , Yoshimi Oura , Teppei Shinno
- 申请人: Yoshimitsu Morita , Yoshimi Oura , Teppei Shinno
- 优先权: JP2001-355323 20011120
- 国际申请: PCT/JP02/12034 WO 20021118
- 主分类号: G01N27/416
- IPC分类号: G01N27/416 ; G01N27/49 ; G01N33/487 ; G01F1/64
摘要:
An analyzer (A) includes a current measurer (42) for measuring the current flowing between paired electrodes (22a), (22b) when a sample is introduced to the reagent layer (23) of a sensor (2) and voltage is applied across the electrodes, while also including a processor (3) for analyzing the sample based on the current after a predetermined reference time point. The analyzer (A) further includes a fail determiner (44) which monitors the change of the current before and after the reference time point and determines that the sensor (2) is improper when the current change does not correspond to a predetermined current change.
公开/授权文献
- US07008525B2 Fail judging method and analyzer 公开/授权日:2006-03-07
信息查询