发明申请
- 专利标题： X-ray inspection apparatus and X-ray inspection method
- 专利标题（中）： X射线检查仪和X射线检查方法
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申请号： US10924363申请日： 2004-08-23
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公开(公告)号： US20050074088A1公开(公告)日： 2005-04-07
- 发明人: Masaru Ichihara , Shinji Yoshino , Hiroyuki Inoue , Toshio Kinoshita , Kazuo Ohuchi
- 申请人： Masaru Ichihara , Shinji Yoshino , Hiroyuki Inoue , Toshio Kinoshita , Kazuo Ohuchi
- 申请人地址： JP Osaka
- 专利权人： Matsushita Electric Industrial Co., Ltd.
- 当前专利权人： Matsushita Electric Industrial Co., Ltd.
- 当前专利权人地址： JP Osaka
- 优先权： JP2003-303188 20030827; JP2003-330180 20030922
- 主分类号： A61B6/00
- IPC分类号： A61B6/00 ; G01B15/06 ; G01N23/02 ; G01N23/04 ; H05G1/02 ; H05G1/08 ; H05G1/26
摘要：
The X-ray inspection device and the X-ray inspection method according to the present invention are configured to hold an object to be inspected irradiated with an X-ray from an X-ray irradiation device, uses a swinging device for performing swinging motion of tilting the object to be inspected at an arbitrary angle and in an arbitrary direction, images the X-ray that passes through the object to be inspected in an X-ray detection device and extracts data of a desired cross section from the X-ray image of the X-ray detection device in a control device.
公开/授权文献
- US07099432B2 X-ray inspection apparatus and X-ray inspection method 公开/授权日：2006-08-29
信息查询
