发明申请
US20050076827A1 Process for calibrating the temperature control unit of an oven and oven for carrying out this process 有权
用于校准烤箱和烤箱的温度控制单元以进行该过程的过程

  • 专利标题: Process for calibrating the temperature control unit of an oven and oven for carrying out this process
  • 专利标题(中): 用于校准烤箱和烤箱的温度控制单元以进行该过程的过程
  • 申请号: US10631571
    申请日: 2003-07-30
  • 公开(公告)号: US20050076827A1
    公开(公告)日: 2005-04-14
  • 发明人: Andreas Muhe
  • 申请人: Andreas Muhe
  • 优先权: DE10246567.3 20021005
  • 主分类号: C30B11/00
  • IPC分类号: C30B11/00 F27D99/00 C30B9/00 C30B17/00 C30B21/02 C30B28/06
Process for calibrating the temperature control unit of an oven and oven for carrying out this process
摘要:
In a process for calibrating the temperature control unit of a vertical gradient freeze crystal growth oven, instead of the fused material a test body (3) is used in the oven (1) that does not melt at the oven temperature, that has a heat conductivity comparable to the fused material and a central bore (4). After turning on the resistance heaters (8, 9, 10) of the oven (1) the temperature at the level of the individual control temperature indicators (11, 12, 13) of the oven (1) is measured via a reference temperature indicator (5) than can be fully inserted into the bore (4) and subsequently the output of the respective resistance heaters (8, 9, 10) is set to a desired temperature value. In the process the difference to the temperature of the respective control temperature indicators (11, 12, 13) is determined. After removing the test body (3) and the reference temperature indicator (5) the oven (1) is operated according to the control temperature indicators (11, 12 13) taking into consideration the previously determined differences between the reference temperatures and the temperature values of the control temperature indicators (11, 12, 13).
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