Invention Application
- Patent Title: METHOD AND APPARATUS FOR TESTING A BRIDGE CIRCUIT
- Patent Title (中): 测试电路的方法和装置
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Application No.: US10904047Application Date: 2004-10-21
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Publication No.: US20050086019A1Publication Date: 2005-04-21
- Inventor: Biyun Yeh , Victor Wu , Jiin Lai
- Applicant: Biyun Yeh , Victor Wu , Jiin Lai
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/317 ; G06F19/00 ; G01R31/00

Abstract:
A method and an apparatus for testing a bridge circuit. The method includes inputting a first test clock to a first conversion unit for triggering the first conversion unit to transfer a test data to a second conversion unit according to rising edges of the first test clock, inputting a second test clock to the second conversion unit for triggering the second conversion unit to output an output data according to falling edges of the second test clock, and controlling the first test clock and the second test clock so that the rising edges of the second test clock are not synchronized to the rising edges of the first test clock. A frequency of the first test clock is an even multiple of a frequency of the second test clock.
Public/Granted literature
- US07231309B2 Method and apparatus for testing a bridge circuit Public/Granted day:2007-06-12
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