发明申请
- 专利标题: Systems for Built-In-Self-Test for content addressable memories and methods of operating the same
- 专利标题(中): 用于内容可寻址存储器的内置自检系统及其操作方法
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申请号: US10922825申请日: 2004-08-20
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公开(公告)号: US20050088904A1公开(公告)日: 2005-04-28
- 发明人: Mohit Jain , Danish Syed
- 申请人: Mohit Jain , Danish Syed
- 申请人地址: IN uttar Pradesh
- 专利权人: STMICROELECTRONICS PVT. LTD.
- 当前专利权人: STMICROELECTRONICS PVT. LTD.
- 当前专利权人地址: IN uttar Pradesh
- 优先权: IN1032/DEL/2003 20030821
- 主分类号: G11C15/00
- IPC分类号: G11C15/00 ; G11C29/38
摘要:
An improved Built-In-Self-Test (BIST) architecture for Content Addressable Memory (CAM) devices, comprising a bit scanner for reading out the contents of the matchlines of the CAM cells as a serial bit stream; a bit transition detector that detects and determines the address of each bit transition in the serial bit stream; a state machine that generates bit addresses for each expected transition in the serial bit stream; and an analyser that compares expected transition bit addresses with detected transition addresses and declares a BIST failure if expected and detected transition addresses do not match at any point in the bit stream.
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