Invention Application
US20050098728A1 Systems and methods for non-destructively detecting material abnormalities beneath a coated surface
有权
用于非破坏性地检测涂层表面下的材料异常的系统和方法
- Patent Title: Systems and methods for non-destructively detecting material abnormalities beneath a coated surface
- Patent Title (中): 用于非破坏性地检测涂层表面下的材料异常的系统和方法
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Application No.: US10949571Application Date: 2004-09-24
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Publication No.: US20050098728A1Publication Date: 2005-05-12
- Inventor: Robert Alfano , Baolong Yu
- Applicant: Robert Alfano , Baolong Yu
- Main IPC: G01N21/17
- IPC: G01N21/17 ; G01N21/35
Abstract:
The present invention provides systems and methods for non-destructively detecting material abnormalities beneath a coated surface. A terahertz (THz) illumination unit illuminates an area of the coated surface. A detection unit detects light reflected from the illuminated area of the coated surface, and a processing unit images the illuminated area of the coated surface from optical characteristics received from the detection unit.
Public/Granted literature
- US07145148B2 Systems and methods for non-destructively detecting material abnormalities beneath a coated surface Public/Granted day:2006-12-05
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