Invention Application
- Patent Title: Probe for testing a device under test
- Patent Title (中): 探测用于测试被测设备
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Application No.: US10445174Application Date: 2003-05-23
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Publication No.: US20050099191A1Publication Date: 2005-05-12
- Inventor: K. Gleason , Tim Lesher , Mike Andrews , John Martin
- Applicant: K. Gleason , Tim Lesher , Mike Andrews , John Martin
- Main IPC: G01R1/067
- IPC: G01R1/067 ; G01R1/073 ; G01R31/02
Abstract:
A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
Public/Granted literature
- US07057404B2 Shielded probe for testing a device under test Public/Granted day:2006-06-06
Information query
