发明申请
US20050122796A1 Delayed locked loop in semiconductor memory device and its control method
审中-公开
半导体存储器件中的延迟锁定环及其控制方法
- 专利标题: Delayed locked loop in semiconductor memory device and its control method
- 专利标题(中): 半导体存储器件中的延迟锁定环及其控制方法
-
申请号: US10876426申请日: 2004-06-25
-
公开(公告)号: US20050122796A1公开(公告)日: 2005-06-09
- 发明人: Hea-Suk Jung , Jong-Tae Kwak
- 申请人: Hea-Suk Jung , Jong-Tae Kwak
- 优先权: KR2003-87567 20031204
- 主分类号: G11C11/407
- IPC分类号: G11C11/407 ; G11C7/00 ; G11C7/10 ; H03L7/081
摘要:
A delayed locked loop in a semiconductor memory device includes a read enable signal generating block for generating a read enable signal, wherein the read enable signal is enabled based on the application of a read command, and is disabled when all data is read out and outputted; a first internal clock controlling block for intermitting the output of a first internal clock through the use of the read enable signal; a second internal clock controlling block for intermitting the output of a second internal clock through the use of the read enable signal; a DLL clock generating block for receiving the first and second internal clocks to thereby generate first and second DLL clocks.
公开/授权文献
- US1723579A Electric-current rectifier 公开/授权日:1929-08-06
信息查询
IPC分类: