发明申请
US20050122796A1 Delayed locked loop in semiconductor memory device and its control method 审中-公开
半导体存储器件中的延迟锁定环及其控制方法

  • 专利标题: Delayed locked loop in semiconductor memory device and its control method
  • 专利标题(中): 半导体存储器件中的延迟锁定环及其控制方法
  • 申请号: US10876426
    申请日: 2004-06-25
  • 公开(公告)号: US20050122796A1
    公开(公告)日: 2005-06-09
  • 发明人: Hea-Suk JungJong-Tae Kwak
  • 申请人: Hea-Suk JungJong-Tae Kwak
  • 优先权: KR2003-87567 20031204
  • 主分类号: G11C11/407
  • IPC分类号: G11C11/407 G11C7/00 G11C7/10 H03L7/081
Delayed locked loop in semiconductor memory device and its control method
摘要:
A delayed locked loop in a semiconductor memory device includes a read enable signal generating block for generating a read enable signal, wherein the read enable signal is enabled based on the application of a read command, and is disabled when all data is read out and outputted; a first internal clock controlling block for intermitting the output of a first internal clock through the use of the read enable signal; a second internal clock controlling block for intermitting the output of a second internal clock through the use of the read enable signal; a DLL clock generating block for receiving the first and second internal clocks to thereby generate first and second DLL clocks.
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