发明申请
US20050162954A1 Semiconductor memory 有权
半导体存储器

Semiconductor memory
摘要:
In a normal operation, an output of a differential amplifier for amplifying a difference between first and second bit cells is output as readout data. In a test mode, when a first control signal is set to be “H”, the output of the differential amplifier is fixed to be “H” and thus an output of the first bit cell is read out through gates.
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