摘要:
Provided is a semiconductor memory, comprising: a voltage converting circuit which voltage-converts a resistance difference between a first and a second resistance elements; a voltage comparing circuit which outputs an output corresponding to the voltage conversion; a latch circuit for holding the output of the voltage comparing circuit; and a switch circuit which cuts and connects the voltage converting circuit and the voltage comparing circuit.
摘要:
Selection signals output from a decoder are selectively set at High according to the states (blown or not blown) or fuses in bit cells in a cell group specifying circuit. Then, one of transistor gates is turned ON so that a data bit cell group in/from which data is written and read out is selected. Accordingly, stored data can be rewritten multiple times by sequentially blowing the fuses in the cell group specifying circuit.
摘要:
In a normal operation, an output of a differential amplifier for amplifying a difference between first and second bit cells is output as readout data. In a test mode, when a first control signal is set to be “H”, the output of the differential amplifier is fixed to be “H” and thus an output of the first bit cell is read out through gates.
摘要:
Provided is a semiconductor memory, comprising: a voltage converting circuit which voltage-converts a resistance difference between a first and a second resistance elements; a voltage comparing circuit which outputs an output corresponding to the voltage conversion; a latch circuit for holding the output of the voltage comparing circuit; and a switch circuit which cuts and connects the voltage converting circuit and the voltage comparing circuit.
摘要:
The layout of the semiconductor storage circuit is generated by placing, along a word line direction, a desired number of a circuit extension units each of which includes a data access circuit section, memory cell sub arrays and a power circuit section arranged along a bit line direction. The data access circuit section is driven by a driver circuit provided in the data access circuit section, and the driving operation of the driver circuit is controlled by a driver circuit provided in a control circuit section. Also, a voltage supplying operation of the power circuit section is controlled by a driver circuit provided in a power control circuit section.
摘要:
A nonvolatile semiconductor memory device includes: a first bit cell including a first MOS transistor whose source and drain are connected to form a first control gate and a second MOS transistor which has a floating gate in common with the first MOS transistor; a second bit cell including a third MOS transistor whose source and drain are connected to form a second control gate and a fourth MOS transistor which has a floating gate in common with the third MOS transistor; and a differential amplifier which receives input signals from drains of the respective second and fourth MOS transistors.
摘要:
A port A of the path including a first transistor of a memory cell to be accessed, a first bit line pair, a first column selection switch and a data line pair interleaves with a port B of the path including a second transistor of the memory cell to be accessed, a second bit line pair, a second column selection switch and the data line pair in two cycles of a clock. A read amplifier amplifies data transferred from a bit line pair to the data line pair and outputs the resultant data to an input/output buffer in one cycle of the clock. The input/output buffer outputs the data received from the read amplifier to the outside in one cycle of the clock.
摘要:
A timing signal generation circuit according to the present invention includes: a delay circuit for transmitting an input clock signal while delaying the clock signal, the delay circuit having a plurality of intermediate taps capable of outputting the clock signal at their corresponding positions in the delay circuit; a detection delay circuit for transmitting the clock signal while delaying the clock signal, the detection delay circuit having a plurality of intermediate taps capable of outputting the clock signal at their corresponding positions in the detection delay circuit; a plurality of sample/hold circuits each having a sampling signal terminal, the sampling signal terminals being connected to corresponding ones of the plurality of intermediate taps of the detection delay circuit; a plurality of boundary delay circuits for detecting an edge of the clock signal, the boundary detection circuits being connected to respective output terminals of the sample/hold circuits; and an output selection circuit for extracting the clock signal via at least one of the plurality of intermediate taps selected in accordance with an edge position of the clock signal detected by the boundary detection circuits, the output selection circuit outputting the extracted clock signal as a timing signal.
摘要:
The semiconductor memory device of the invention includes: a data storage section for storing data thereon; a data write section for writing data on the storage section; and a data read section for reading out the data stored on the storage section. The read section generates a read clock signal responsive to an external clock signal, and the write section generates a write clock signal responsive to the external clock signal. And one cycle of the read clock signal is set shorter than one cycle of the write clock signal.
摘要:
A fuse device and a program transistor are connected in series with each other. A flip-flop turns ON, in response to a start signal, the program transistor to start program of the fuse device. A 2-input NAND circuit outputs an end signal at a time point where change in a resistance value of the fuse device is increased to reach a predetermined level while monitoring change in the resistance value of the fuse device through change in a voltage at a junction point of the fuse device and the program transistor. The flip-flop turns OFF, in response to the end signal, the program transistor to automatically terminate the program of the fuse device. Thus, the resistance value of the fuse device is increased to the predetermined level in a minimum program time.