发明申请
- 专利标题: Phase change memory devices including memory elements having variable cross-sectional areas
- 专利标题(中): 相变存储器件包括具有可变横截面积的存储元件
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申请号: US11017594申请日: 2004-12-20
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公开(公告)号: US20050167645A1公开(公告)日: 2005-08-04
- 发明人: Young-tae Kim , Young-nam Hwang , Tai-kyung Kim , Won-young Chung , Keun-ho Lee
- 申请人: Young-tae Kim , Young-nam Hwang , Tai-kyung Kim , Won-young Chung , Keun-ho Lee
- 优先权: KR04-5649 20040129
- 主分类号: H01L27/108
- IPC分类号: H01L27/108 ; H01L29/02 ; H01L45/00
摘要:
A phase-change memory device may include first and second spaced apart conductive electrodes, and a phase-change memory element coupled between the first and second conductive electrodes. More particularly, a first portion of the phase-change memory element may have a first cross-sectional area along a current path between the first and second conductive electrodes, and a second portion of the phase-change memory element may have a second cross-sectional area along the current path between the first and second conductive electrodes. Moreover, the first and second cross-sectional areas may be different.
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