发明申请
- 专利标题： Integrated circuit devices having reducing variable retention characteristics
- 专利标题（中）： 具有降低可变保持特性的集成电路器件
-
申请号： US11101801申请日： 2005-04-07
-
公开(公告)号： US20050174871A1公开(公告)日： 2005-08-11
- 发明人: Russell Meyer , Ray Beffa
- 申请人： Russell Meyer , Ray Beffa
- 主分类号： G11C7/04
- IPC分类号： G11C7/04 ; G11C11/406 ; G11C7/00
摘要：
The illustrated embodiments relate to a process for improving retention time of a set of integrated circuit devices. The process comprises placing the set of integrated circuit devices in a reverse bias condition, and elevating the surrounding temperature of the set of integrated circuit devices for a predetermined period of time.
公开/授权文献
信息查询
