发明申请
US20050179059A1 Well for CMOS imager and method of formation 有权
好的CMOS成像器和形成方法

Well for CMOS imager and method of formation
摘要:
A well region of a first conductivity type located in a substrate of the first conductivity type and below about half the channel length of an electrically active portion of a transistor gate is disclosed. The well region is laterally displaced from a charge collection region of a second conductivity type of a pinned photodiode.
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