发明申请
- 专利标题: Image evaluation method and microscope
- 专利标题(中): 图像评估方法和显微镜
-
申请号: US11124252申请日: 2005-05-09
-
公开(公告)号: US20050199811A1公开(公告)日: 2005-09-15
- 发明人: Tohru Ishitani , Mitsugu Sato , Hideo Todokoro , Tadashi Otaka , Takashi Iizumi , Atsushi Takane
- 申请人: Tohru Ishitani , Mitsugu Sato , Hideo Todokoro , Tadashi Otaka , Takashi Iizumi , Atsushi Takane
- 优先权: JP2001-253752 20010824; JP2002-62817 20020308
- 主分类号: H01J37/04
- IPC分类号: H01J37/04 ; H01J37/22 ; H01J37/26 ; H01J37/28 ; G21K7/00
摘要:
Image evaluation method capable of objectively evaluating the image resolution of a microscope image. An image resolution method is characterized in that resolution in partial regions of an image is obtained over an entire area of the image or a portion of the image, averaging is performed over the entire area of the image or the portion of the image, and the averaged value is established as the resolution evaluation value of the entire area of the image or the portion of the image. This method eliminates the subjective impressions of the evaluator from evaluation of microscope image resolution, so image resolution evaluation values of high accuracy and good repeatability can be obtained.
公开/授权文献
- US07340111B2 Image evaluation method and microscope 公开/授权日:2008-03-04
信息查询