发明申请
US20050214740A1 Device for measuring extracellular potential and manufacturing method of the same
审中-公开
用于测量细胞外电位的装置及其制造方法
- 专利标题： Device for measuring extracellular potential and manufacturing method of the same
- 专利标题（中）： 用于测量细胞外电位的装置及其制造方法
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申请号： US11081759申请日： 2005-03-17
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公开(公告)号： US20050214740A1公开(公告)日： 2005-09-29
- 发明人: Hiroshi Ushio , Masaya Nakatani , Hiroaki Oka , Nobuhiko Ozaki
- 申请人： Hiroshi Ushio , Masaya Nakatani , Hiroaki Oka , Nobuhiko Ozaki
- 申请人地址： JP Kadoma-shi
- 专利权人： Matsushita Elec. Ind. Co., Ltd.
- 当前专利权人： Matsushita Elec. Ind. Co., Ltd.
- 当前专利权人地址： JP Kadoma-shi
- 优先权： JP2004-82240 20040322
- 主分类号： G01N33/48
- IPC分类号： G01N33/48 ; A61B5/04 ; C12M1/00 ; C12M1/34 ; C12P21/06 ; C12Q1/00 ; G01N33/487
摘要：
A device for measuring extracellular potential includes a diaphragm and a detecting electrode. The diaphragm is formed on one surface thereof with a depression including at least one curved surface, and a hole is provided so as to penetrate from the curved surface of the depression through to the other surface of the diaphragm. An opening on the curved surface of the depression is smaller than an opening on the other side, and a detecting electrode is provided on the wall surface of the hole.
信息查询
