发明申请
US20050233366A1 Sample-analyzing device and process for manufacturing the same 审中-公开
样品分析装置及其制造方法

  • 专利标题: Sample-analyzing device and process for manufacturing the same
  • 专利标题(中): 样品分析装置及其制造方法
  • 申请号: US11103564
    申请日: 2005-04-12
  • 公开(公告)号: US20050233366A1
    公开(公告)日: 2005-10-20
  • 发明人: Norihisa Mino
  • 申请人: Norihisa Mino
  • 优先权: JP2004-121908 20040416
  • 主分类号: B01L3/00
  • IPC分类号: B01L3/00 G01N21/25 C12Q1/68 C12M1/34
Sample-analyzing device and process for manufacturing the same
摘要:
Sample-analyzing device 100 has a substrate 1 having a sample-loading face F1 having two or more dents 3 each formed for independently storing two or more droplets containing an analyte. The sample-loading face F1 is divided at least into a first area F11 coated with a hydrophobic organic molecular film 2 and two or more second areas F12 of which the inside is not coated with the organic molecular film 2 and the entire peripheral area is surrounded by the first area. Each of the bottom face of the dents 3 constitutes the second area F12 and each of the peripheral area of the dents 3 including its internal side surface is formed with the organic molecular film 2 coating the first area. The organic molecular film 2 is formed by using an organic molecule and bound to the face F1 via covalent bonds.
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