发明申请
US20050236570A1 Charged particle beam adjusting method and charged particle beam apparatus 有权
带电粒子束调节法和带电粒子束装置

Charged particle beam adjusting method and charged particle beam apparatus
摘要:
In an apparatus for obtaining an image by irradiating a charged particle beam on a specimen, a condition of the beam conditioned differently from vertical incidence as in the case of the beam being tilted is required to be adjusted. To this end, the apparatus has a controller for automatically controlling a stigmator, an objective lens and a deflector such that astigmatism is corrected, focus is adjusted and view filed shift is corrected. The controller has a selector for inhibiting at least one of the astigmatism correction, focus adjustment and FOV shift correction from being executed.
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