发明申请
- 专利标题： Method for testing precursor of secondary cell, its testing instrument, and method for manufacturing secondary cell using the method
- 专利标题（中）： 使用该方法测试二次电池前体的方法，其测试仪器和制造二次电池的方法
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申请号： US10523177申请日： 2003-08-14
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公开(公告)号： US20050242820A1公开(公告)日： 2005-11-03
- 发明人: Toshiro Kume , Masashi Shoji , Emiko Igaki , Shuji Tsutsumi , Mikinari Shimada , Masakazu Tanahashi , Akira Takahashi , Shouichi Imashuku
- 申请人： Toshiro Kume , Masashi Shoji , Emiko Igaki , Shuji Tsutsumi , Mikinari Shimada , Masakazu Tanahashi , Akira Takahashi , Shouichi Imashuku
- 申请人地址： JP Kadoma-shi, Osaka 571-8501
- 专利权人： Matsushita Electric Industrial Co., Ltd.
- 当前专利权人： Matsushita Electric Industrial Co., Ltd.
- 当前专利权人地址： JP Kadoma-shi, Osaka 571-8501
- 优先权： JP2002-251928 20020829
- 国际申请： PCT/JP03/10361 WO 20030814
- 主分类号： G01N27/416
- IPC分类号： G01N27/416 ; G01R31/36 ; H01M10/04 ; H01M10/0525 ; H01M10/36 ; H01M10/42 ; H01M10/44
摘要：
A method for testing a precursor of a secondary cell with high reliability and high efficiency to judge the precursor to be acceptable or defective. The current flowing when a test voltage is applied between a pair of electrodes is measured before an electrolyte is placed between the electrodes. If a current the current value of which exceeds a predetermined reference current value (13) is detected during the time from the start of application of a voltage to a normal secondary cell precursor until the current becomes constant, the precursor is determined to be defective.
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