发明申请
US20050244093A1 Wavelength-tuned intensity measurement of surface plasmon resonance sensor
审中-公开
表面等离子体共振传感器的波长调谐强度测量
- 专利标题: Wavelength-tuned intensity measurement of surface plasmon resonance sensor
- 专利标题(中): 表面等离子体共振传感器的波长调谐强度测量
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申请号: US10838790申请日: 2004-05-03
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公开(公告)号: US20050244093A1公开(公告)日: 2005-11-03
- 发明人: Gregory VanWiggeren , Daniel Roitman
- 申请人: Gregory VanWiggeren , Daniel Roitman
- 主分类号: G01N21/27
- IPC分类号: G01N21/27 ; G01N21/39 ; G01N21/55 ; G02B6/00
摘要:
An incident signal illuminates an SPR sensor over a wavelength range. Intensity of a reflected signal from the SPR sensor is detected with wavelength discrimination imposed on the incident signal or the reflected signal. The wavelength discrimination is imposed at a predesignated tuning rate within the wavelength range. The detected intensity is then sampled at a sampling rate and an intensity profile associated with the SPR sensor is established from the sampling with a wavelength resolution determined by the tuning rate and the sampling rate.
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