Invention Application
- Patent Title: Vent configuration for sample element
- Patent Title (中): 抽样元件的排气口配置
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Application No.: US11123426Application Date: 2005-05-06
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Publication No.: US20050250217A1Publication Date: 2005-11-10
- Inventor: Rich Keenan , Ken Li
- Applicant: Rich Keenan , Ken Li
- Main IPC: B01L3/00
- IPC: B01L3/00 ; G01N21/00 ; G01N21/03 ; G01N21/27 ; G01N21/31

Abstract:
Disclosed is a sample element for use in analyzing a concentration of an analyte in a material sample. The sample element comprises a sample chamber having at least one window, and a supply passage extending from the sample chamber. The supply passage defines a supply axis. The sample element further comprises a vent opening in fluid communication with the sample chamber. The vent opening is offset from the supply axis as the sample element is viewed orthogonal to the window.
Information query
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