发明申请
US20050264909A1 Methods and apparatus determining and/or using overshoot control of write current for optimized head write control in assembled disk drives
失效
方法和装置确定和/或使用写入电流的过冲控制,以便在组装的磁盘驱动器中优化磁头写入控制
- 专利标题: Methods and apparatus determining and/or using overshoot control of write current for optimized head write control in assembled disk drives
- 专利标题(中): 方法和装置确定和/或使用写入电流的过冲控制,以便在组装的磁盘驱动器中优化磁头写入控制
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申请号: US11176414申请日: 2005-07-06
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公开(公告)号: US20050264909A1公开(公告)日: 2005-12-01
- 发明人: Hae Jung Lee , Sang Lee , Keung Cho
- 申请人: Hae Jung Lee , Sang Lee , Keung Cho
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 主分类号: G11B21/02
- IPC分类号: G11B21/02 ; G11B5/00 ; G11B5/02 ; G11B5/455
摘要:
The invention includes a testing method which may be applied to at least one writer in a disk drive during the self-test phase to generate write parameters, focused on the Over Shoot Control (OSC) of the write current parameter to improve the reliability of write operations by that writer. The Minimum OSC is used for write operations in normal temperatures. The Optimum OSC is used for a first lower temperature range, preferably between essentially 15 degrees Centigrade and essentially 5 degrees Centigrade. The Maximum OSC is preferred below essentially 5 degrees Centigrade. The Minimum OSC should preferably guarantee both an Adjacent Track Write (ATW) criteria, as well as guarantee a Write Induced Instability (WII) criteria. The invention includes the write parameter collection, as well as the disk drive containing the generated write parameter collection. The invention also includes the method of using that write parameter collection to control a writer while writing to tracks belonging to the radial zone collection and program systems implementing the invention's methods.
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