Invention Application
US20050280505A1 Inventorying RFID tags by employing a query parameter Q that is adjusted for improving
审中-公开
通过采用调整为改进的查询参数Q来清点RFID标签
- Patent Title: Inventorying RFID tags by employing a query parameter Q that is adjusted for improving
- Patent Title (中): 通过采用调整为改进的查询参数Q来清点RFID标签
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Application No.: US11210384Application Date: 2005-08-24
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Publication No.: US20050280505A1Publication Date: 2005-12-22
- Inventor: Todd Humes , Christopher Diorio , Scott Cooper , Vadim Lobanov
- Applicant: Todd Humes , Christopher Diorio , Scott Cooper , Vadim Lobanov
- Applicant Address: US WA Seattle
- Assignee: IMPINJ, Inc.
- Current Assignee: IMPINJ, Inc.
- Current Assignee Address: US WA Seattle
- Main IPC: G06K7/00
- IPC: G06K7/00 ; G08B13/14 ; H04Q5/22

Abstract:
An RFID reader inventories a population of tags. The reader evaluates responses from tags by categorizing them in slots. As tags are inventoried, the number of slots based on a Q-parameter is reduced. The reader addresses the tags by communicating a Q1 value for the Q parameter, generates first contents from replies received from the tags, and computes a first merit statistic based on the first contents. Next, the reader determines a Q2 value for the Q parameter, which if used in the same way would meet a preset fairway condition better than the first merit statistic. After determining the Q2 value, the reader addresses a portion of the tags by communicating the Q2 value for the Q parameter.
Information query