发明申请
- 专利标题: Method for producing a dielectric and semiconductor structure
- 专利标题(中): 电介质和半导体结构的制造方法
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申请号: US11167946申请日: 2005-06-28
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公开(公告)号: US20060017132A1公开(公告)日: 2006-01-26
- 发明人: Albert Birner , Andreas Weber , Till Schloesser , Joern Luetzen
- 申请人: Albert Birner , Andreas Weber , Till Schloesser , Joern Luetzen
- 申请人地址: DE Munich 81669
- 专利权人: INFINEON TECHNOLOGIES AG
- 当前专利权人: INFINEON TECHNOLOGIES AG
- 当前专利权人地址: DE Munich 81669
- 优先权: DE102004031453.5 20040629
- 主分类号: H01L29/00
- IPC分类号: H01L29/00
摘要:
The present invention relates to a method for producing a dielectric on a semiconductor body having the following steps that are to be performed successively: provision of a semiconductor body, application of a dielectric layer on at least parts of a first surface of the semiconductor body in such a way as at least partly to form an interface between the dielectric layer and the semiconductor body, and thermal annealing of the semiconductor body and the dielectric layer. The method according to the invention is distinguished by the fact that temporally prior to the annealing, for the purpose of improving the saturation and the electrical properties, fluorine-containing particles are introduced into regions of the semiconductor body and/or of the dielectric layer which adjoin the interface. The present invention furthermore relates to a corresponding semiconductor structure.
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