Invention Application
- Patent Title: Probe for semiconductor devices
- Patent Title (中): 探头用于半导体器件
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Application No.: US11256514Application Date: 2005-10-19
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Publication No.: US20060033517A1Publication Date: 2006-02-16
- Inventor: Igor Khandros , Gaetan Mathieu
- Applicant: Igor Khandros , Gaetan Mathieu
- Assignee: FormFactor, Inc.
- Current Assignee: FormFactor, Inc.
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
An interconnection contact structure assembly including an electronic component having a surface and a conductive contact carried by the electronic component and accessible at the surface. The contact structure includes an internal flexible elongate member having first and second ends and with the first end forming a first intimate bond to the surface of said conductive contact terminal without the use of a separate bonding material. An electrically conductive shell is provided and is formed of at least one layer of a conductive material enveloping the elongate member and forming a second intimate bond with at least a portion of the conductive contact terminal immediately adjacent the first intimate bond.
Public/Granted literature
- US07200930B2 Probe for semiconductor devices Public/Granted day:2007-04-10
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