- 专利标题: Method for manufacturing semiconductor device
-
申请号: US11206787申请日: 2005-08-19
-
公开(公告)号: US20060046476A1公开(公告)日: 2006-03-02
- 发明人: Osamu Nakamura , Junko Sato
- 申请人: Osamu Nakamura , Junko Sato
- 申请人地址: JP Atsugi-shi
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP Atsugi-shi
- 优先权: JP2004-252464 20040831
- 主分类号: H01L21/44
- IPC分类号: H01L21/44 ; H01L21/31 ; H01L21/3205 ; H01L21/8234 ; H01L21/84
摘要:
The present invention provides a method for forming a semiconductor region having a desired shape, and also provides a method for manufacturing a semiconductor device with few variations. Moreover, the present invention provides a method for manufacturing a semiconductor device which can reduce the cost with a small number of materials and with high yield. According to the present invention, after a semiconductor film is partially oxidized to form an oxide layer, the semiconductor film is etched using the oxide layer as a mask to form a semiconductor region having a desired shape, and thereafter a semiconductor device using the semiconductor region is manufactured. Thus, a semiconductor region having a desired shape can be formed in a predetermined position without using a known photolithography step using a resist.
公开/授权文献
- US07622338B2 Method for manufacturing semiconductor device 公开/授权日:2009-11-24
信息查询
IPC分类: