Invention Application
- Patent Title: Converting a digital radiograph to an absolute thickness map
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Application No.: US11108498Application Date: 2005-04-18
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Publication No.: US20060058974A1Publication Date: 2006-03-16
- Inventor: Brian Lasiuk , Thomas Batzinger , Manoharan Venugopal , Elizabeth Dixon , Michael Hopple , Nityanand Gopalika , Sivaramanivas Ramaswamy , Debasish Mishra , Rajashekar Venkatachalam , Vamshi Reddy Kommareddy
- Applicant: Brian Lasiuk , Thomas Batzinger , Manoharan Venugopal , Elizabeth Dixon , Michael Hopple , Nityanand Gopalika , Sivaramanivas Ramaswamy , Debasish Mishra , Rajashekar Venkatachalam , Vamshi Reddy Kommareddy
- Applicant Address: US PA Trevose
- Assignee: GE Betz, Inc.
- Current Assignee: GE Betz, Inc.
- Current Assignee Address: US PA Trevose
- Main IPC: G01C25/00
- IPC: G01C25/00 ; G06F19/00

Abstract:
A digital radiography imaging system for acquiring digital images of an object, and a method for transforming digital images into an absolute thickness map characterizing the object under inspection. The system includes a radiation source for directing radiation through a desired region of the object, and a radiation detector having a plurality of sensing elements for detecting radiation passing through the object. Numerical data generated from each sensing element is calibrated, for example by correcting for variations in radiation paths between the source and detector, by correcting for variations in the spatial frequency response (MTF) of the detector, by correcting for variations in the geometric profile of the object under inspection, and by correcting for material contained in and/or around the object. The calibrated data is processed in order to generate and display an absolute thickness map of the object. The calibration procedures are adapted for extracting a thickness map from both isotope sources and X-ray tube sources.
Public/Granted literature
- US07480363B2 Converting a digital radiograph to an absolute thickness map Public/Granted day:2009-01-20
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