发明申请
- 专利标题: SUB-LITHOGRAPHIC IMAGING TECHNIQUES AND PROCESSES
- 专利标题(中): 子图像成像技术和方法
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申请号: US10711458申请日: 2004-09-20
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公开(公告)号: US20060060562A1公开(公告)日: 2006-03-23
- 发明人: Toshiharu Furukawa , Mark Hakey , Steven Holmes , David Horak , Charles Koburger , Peter Mitchell , Larry Nesbit , James Slinkman
- 申请人: Toshiharu Furukawa , Mark Hakey , Steven Holmes , David Horak , Charles Koburger , Peter Mitchell , Larry Nesbit , James Slinkman
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 主分类号: C23F1/00
- IPC分类号: C23F1/00 ; B44C1/22 ; G03C5/00
摘要:
A method of patterning which provides images substantially smaller than that possible by lithographic techniques is provided. In the method of the invention, a substrate has a memory layer and a sacrificial layer formed thereon. An image is patterned onto the memory layer by protecting an edge during an etching step using chemical oxide removal (COR) processes, for example. Another edge is memorized in the layer. The sacrificial layer is removed to expose another memorized edge, which is used to define a pattern in an underlying layer.
公开/授权文献
- US07585614B2 Sub-lithographic imaging techniques and processes 公开/授权日:2009-09-08
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