发明申请
- 专利标题: Inspection unit
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申请号: US11238054申请日: 2005-09-29
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公开(公告)号: US20060066331A1公开(公告)日: 2006-03-30
- 发明人: Takuto Yoshida , Atsushi Sato
- 申请人: Takuto Yoshida , Atsushi Sato
- 专利权人: YOKOWO CO., LTD.
- 当前专利权人: YOKOWO CO., LTD.
- 优先权: JPP2004-288231 20040930
- 主分类号: G01R31/02
- IPC分类号: G01R31/02
摘要:
A conductive member has a first face adapted to be mounted on a board on which an inspection circuit is arranged and a second face adapted to be opposed to a device to be inspected. The conductive member being formed with a first through hole having a first diameter and communicating the first face with the second face. A contact probe is provided with a tubular body having a second diameter which is smaller than the first diameter, and a plunger retractably projected from one end of the tubular body. A first retainer is formed with a second through hole and opposing at least the second face of the conductive member so as to communicate the first through hole with the second through hole, so that the contact probe is retained in the conductive member while only the plunger is projected from one end of the second through hole. A second retainer is adapted to retain the one end of the tubular body concentrically with the first through hole.
公开/授权文献
- US07126362B2 Inspection unit 公开/授权日:2006-10-24
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