发明申请
- 专利标题: System for testing digital components
- 专利标题(中): 数字元件测试系统
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申请号: US10514537申请日: 2003-05-14
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公开(公告)号: US20060069951A1公开(公告)日: 2006-03-30
- 发明人: Ralf Arnold , Matthias Heinitz , Siegmar Koppe , Volker Schober
- 申请人: Ralf Arnold , Matthias Heinitz , Siegmar Koppe , Volker Schober
- 优先权: DE10221611.8 20020515
- 国际申请: PCT/EP03/05058 WO 20030514
- 主分类号: G06F11/00
- IPC分类号: G06F11/00
摘要:
In order to test digital modules with functional elements, these are divided into test units (3) which respectively have inputs and outputs. Alternating test patterns are applied to the inputs of the test unit (3), and the test responses resulting from this are evaluated at the outputs of the test unit (3). The effect is then encountered that changes at each of the inputs of a test unit (3) do not all affect a particular output of this test unit (3). For every output of the test unit (3), it is possible to define a cone (5) whose apex is formed by the particular output of the test unit (3) and whose base comprises the inputs of the test unit (3) where, and only where, changes affect the particular output. According to the invention, the test pattern to be applied to the inputs of the test unit (3) is constructed of sub-patterns, whose length is in particular
公开/授权文献
- US07386776B2 System for testing digital components 公开/授权日:2008-06-10