Invention Application
- Patent Title: Inversion based stimulus generation for device testing
- Patent Title (中): 用于器件测试的基于反演的刺激生成
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Application No.: US11011397Application Date: 2004-12-14
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Publication No.: US20060069969A1Publication Date: 2006-03-30
- Inventor: Sebastian Ohnewald , Eric Swartzendruber , Kai Eichhorn
- Applicant: Sebastian Ohnewald , Eric Swartzendruber , Kai Eichhorn
- Assignee: Advanced Micro Devices, Inc.
- Current Assignee: Advanced Micro Devices, Inc.
- Priority: DE102004047633.0 20040930
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A device testing apparatus and method for testing a semiconductor device is provided. For device testing, stimulus data is generated and provided to the semiconductor device, and output data of the semiconductor device is then evaluated to verify proper operation of the semiconductor device. Further, data in the semiconductor device output data space is mapped to stimulus data, and a set of stimulus data is determined based on the mapping results for further testing.
Information query
