发明申请
US20060077742A1 Memory devices configured to detect failure of temperature sensors thereof and methods of operating and testing same
失效
被配置为检测其温度传感器的故障的存储器件及其操作和测试方法
- 专利标题： Memory devices configured to detect failure of temperature sensors thereof and methods of operating and testing same
- 专利标题（中）： 被配置为检测其温度传感器的故障的存储器件及其操作和测试方法
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申请号： US11236372申请日： 2005-09-27
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公开(公告)号： US20060077742A1公开(公告)日： 2006-04-13
- 发明人: Jae-Eung Shim , Jung-Yong Choi , Young-Gu Kang , Min-Gyu Hwang
- 申请人： Jae-Eung Shim , Jung-Yong Choi , Young-Gu Kang , Min-Gyu Hwang
- 优先权： KR10-2004-0080809 20041011
- 主分类号： G11C7/00
- IPC分类号： G11C7/00
摘要：
A memory device includes a temperature sensor configured to generate a temperature detection signal responsive to a temperature of the memory device and a self-refresh control circuit configured to control a refresh of the memory device responsive to the temperature detection signal. The device further includes a temperature-detection-error sensing circuit configured to assert a temperature-detection-error signal responsive to an error in the temperature detection signal. The temperature-detection-error sensing circuit may be configured to provide the asserted temperature-detection-error signal at a temperature-detection-error sensing pad configured to be coupled to an external device and/or the device may further include a temperature sensor control circuit configured to control the temperature detection signal responsive to the temperature-detection-error signal. Related operating and testing methods may be provided.
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