发明申请
US20060113494A1 Apparatus and methods for ion beam implantation using ribbon and spot beams
有权
使用色带和点光束进行离子束注入的设备和方法
- 专利标题: Apparatus and methods for ion beam implantation using ribbon and spot beams
- 专利标题(中): 使用色带和点光束进行离子束注入的设备和方法
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申请号: US11209476申请日: 2005-08-22
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公开(公告)号: US20060113494A1公开(公告)日: 2006-06-01
- 发明人: Jiong Chen , Nicholas White
- 申请人: Jiong Chen , Nicholas White
- 主分类号: H01J37/08
- IPC分类号: H01J37/08
摘要:
This invention discloses an ion implantation apparatus with multiple operating modes. It has an ion source and an ion extraction means for extracting a ribbon-shaped ion beam therefrom. The ion implantation apparatus includes a magnetic analyzer for selecting ions with specific mass-to-charge ratio to pass through a mass slit to project onto a substrate. Multipole lenses are provided to control beam uniformity and collimation. The invention further discloses a two-path beamline in which a second path incorporates a deceleration system incorporating energy filtering. The invention discloses methods of ion implantation in which the mode of implantation may be switched from one-dimensional scanning of the target to two-dimensional scanning, and from a simple path to an s-shaped path with deceleration.
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