A combination of burn-in socket and adapter board includes a burn-in socket and an adapter board for connecting the burn-in socket to a test apparatus, the burn-in socket having a body, a shell accommodating the body and defining a receiving hole for receiving a test sample (electronic element) for test, and terminals installed in the body, each terminal having a contact portion suspending in the receiving hole of the shell for the contact of the inserted test sample (electronic element) and a mounting portion extended out of the bottom side of the body and connected to a respective contact at the adapter board.