发明申请
US20060126077A1 Method and apparatus for measuring holding distortion 有权
测量保持失真的方法和装置

  • 专利标题: Method and apparatus for measuring holding distortion
  • 专利标题(中): 测量保持失真的方法和装置
  • 申请号: US11258955
    申请日: 2005-10-27
  • 公开(公告)号: US20060126077A1
    公开(公告)日: 2006-06-15
  • 发明人: Nobuaki UekiKouji Ohtsuka
  • 申请人: Nobuaki UekiKouji Ohtsuka
  • 申请人地址: JP Saitama-shi
  • 专利权人: Fujinon Corporation
  • 当前专利权人: Fujinon Corporation
  • 当前专利权人地址: JP Saitama-shi
  • 优先权: JPP.2004-316788 20041029
  • 主分类号: G01B11/02
  • IPC分类号: G01B11/02
Method and apparatus for measuring holding distortion
摘要:
There are carried out a first measurement operation for measuring the shape of a front surface of a sample held in a held state, a second measurement operation for measuring the shape of a back surface of the sample held in the same state, and a third measurement operation for measuring the shape of the back surface of the sample held so as to cause inverse distortion. First data are acquired on the basis of the front surface shape data obtained through the first measurement operation and the back surface shape data obtained through the second measurement operation. Second data are obtained on the basis of the front surface shape data obtained through the first measurement operation and the back surface shape data obtained through the third measurement operation. Holding distortion is determined on the basis of the first and second data.
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