发明申请
- 专利标题: Method and apparatus for measuring holding distortion
- 专利标题(中): 测量保持失真的方法和装置
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申请号: US11258955申请日: 2005-10-27
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公开(公告)号: US20060126077A1公开(公告)日: 2006-06-15
- 发明人: Nobuaki Ueki , Kouji Ohtsuka
- 申请人: Nobuaki Ueki , Kouji Ohtsuka
- 申请人地址: JP Saitama-shi
- 专利权人: Fujinon Corporation
- 当前专利权人: Fujinon Corporation
- 当前专利权人地址: JP Saitama-shi
- 优先权: JPP.2004-316788 20041029
- 主分类号: G01B11/02
- IPC分类号: G01B11/02
摘要:
There are carried out a first measurement operation for measuring the shape of a front surface of a sample held in a held state, a second measurement operation for measuring the shape of a back surface of the sample held in the same state, and a third measurement operation for measuring the shape of the back surface of the sample held so as to cause inverse distortion. First data are acquired on the basis of the front surface shape data obtained through the first measurement operation and the back surface shape data obtained through the second measurement operation. Second data are obtained on the basis of the front surface shape data obtained through the first measurement operation and the back surface shape data obtained through the third measurement operation. Holding distortion is determined on the basis of the first and second data.
公开/授权文献
- US07342666B2 Method and apparatus for measuring holding distortion 公开/授权日:2008-03-11
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