发明申请
- 专利标题: Eddy current array probes with enhanced drive fields
- 专利标题(中): 具有增强驱动器字段的涡流阵列探头
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申请号: US11023179申请日: 2004-12-22
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公开(公告)号: US20060132123A1公开(公告)日: 2006-06-22
- 发明人: Changting Wang , Yuri Plotnikov , William McKnight , Shridhar Nath , Gigi Gambrell , Mottito Togo , William Hennessy , John Ertel , Shyamsunder Mandayam
- 申请人: Changting Wang , Yuri Plotnikov , William McKnight , Shridhar Nath , Gigi Gambrell , Mottito Togo , William Hennessy , John Ertel , Shyamsunder Mandayam
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 主分类号: G01N27/72
- IPC分类号: G01N27/72
摘要:
Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP includes a number of EC channels and a number of drive coils. Each of the drive coils is provided for a respective one of the EC channels. The drive coils have alternating polarity with respect to neighboring drive coils. In another arrangement, an ECAP for detecting flaws in a number of scanning and orientation configurations includes at least one substrate, a number of sense coils arranged on the substrate(s), and a drive coil encompassing all of the sense coils. In another arrangement, an ECAP includes substrate, sense coils arranged in at least two rows, and at least one drive line. One drive line is provided for each pair of rows and disposed between the rows.
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