EDDY CURRENT ARRAY PROBES WITH ENHANCED DRIVE FIELDS
    1.
    发明申请
    EDDY CURRENT ARRAY PROBES WITH ENHANCED DRIVE FIELDS 审中-公开
    EDDY电流阵列探头与增强型驱动器

    公开(公告)号:US20070222439A1

    公开(公告)日:2007-09-27

    申请号:US11759604

    申请日:2007-06-07

    IPC分类号: G01N27/90 G01N27/72

    CPC分类号: G01N27/902

    摘要: Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP includes a number of EC channels and a number of drive coils. Each of the drive coils is provided for a respective one of the EC channels. The drive coils have alternating polarity with respect to neighboring drive coils. In another arrangement, an ECAP for detecting flaws in a number of scanning and orientation configurations includes at least one substrate, a number of sense coils arranged on the substrate(s), and a drive coil encompassing all of the sense coils. In another arrangement, an ECAP includes substrate, sense coils arranged in at least two rows, and at least one drive line. One drive line is provided for each pair of rows and disposed between the rows.

    摘要翻译: 描述了具有增强的驱动线圈配置的几个涡流阵列探针(ECAP)。 在一种布置中,ECAP包括多个EC通道和多个驱动线圈。 驱动线圈中的每一个为EC通道中的相应一个提供。 驱动线圈相对于相邻的驱动线圈具有交替的极性。 在另一种布置中,用于检测多个扫描和取向配置中的缺陷的ECAP包括至少一个基板,布置在基板上的多个感测线圈以及包围所有感测线圈的驱动线圈。 在另一种布置中,ECAP包括布置成至少两行的衬底,感测线圈和至少一个驱动线。 为每对行提供一条驱动线,并设置在行之间。

    Eddy current probe and inspection method
    2.
    发明申请
    Eddy current probe and inspection method 失效
    涡流探头和检查方法

    公开(公告)号:US20060132124A1

    公开(公告)日:2006-06-22

    申请号:US11019343

    申请日:2004-12-21

    IPC分类号: G01N27/82

    CPC分类号: G01N27/904 G01N27/902

    摘要: An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.

    摘要翻译: 提供用于检查元件的涡流(EC)探头。 EC探针包括切向驱动线圈,该切线驱动线圈被配置为产生用于在部件中感应涡流的探测场,其中涡流的一部分平行于部件的边缘排列。 切向驱动线圈的轴线平行于部件的表面对准。 EC探针还包括一对感测线圈,其中感测线圈的轴线垂直于部件的表面对准。 感测线圈被配置为感测平行于部件的边缘排列的涡流的部分。

    Eddy current array probes with enhanced drive fields
    5.
    发明申请
    Eddy current array probes with enhanced drive fields 审中-公开
    具有增强驱动器字段的涡流阵列探头

    公开(公告)号:US20060132123A1

    公开(公告)日:2006-06-22

    申请号:US11023179

    申请日:2004-12-22

    IPC分类号: G01N27/72

    CPC分类号: G01N27/902

    摘要: Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP includes a number of EC channels and a number of drive coils. Each of the drive coils is provided for a respective one of the EC channels. The drive coils have alternating polarity with respect to neighboring drive coils. In another arrangement, an ECAP for detecting flaws in a number of scanning and orientation configurations includes at least one substrate, a number of sense coils arranged on the substrate(s), and a drive coil encompassing all of the sense coils. In another arrangement, an ECAP includes substrate, sense coils arranged in at least two rows, and at least one drive line. One drive line is provided for each pair of rows and disposed between the rows.

    摘要翻译: 描述了具有增强的驱动线圈配置的几个涡流阵列探针(ECAP)。 在一种布置中,ECAP包括多个EC通道和多个驱动线圈。 驱动线圈中的每一个为EC通道中的相应一个提供。 驱动线圈相对于相邻的驱动线圈具有交替的极性。 在另一种布置中,用于检测多个扫描和取向配置中的缺陷的ECAP包括至少一个基板,布置在基板上的多个感测线圈以及包围所有感测线圈的驱动线圈。 在另一种布置中,ECAP包括布置成至少两行的衬底,感测线圈和至少一个驱动线。 为每对行提供一条驱动线,并设置在行之间。