发明申请
US20060145722A1 Apparatus and method of error detection and correction in a radiation-hardened static random access memory field-programmable gate array
失效
辐射硬化静态随机存取存储器现场可编程门阵列中误差检测和校正的装置和方法
- 专利标题： Apparatus and method of error detection and correction in a radiation-hardened static random access memory field-programmable gate array
- 专利标题（中）： 辐射硬化静态随机存取存储器现场可编程门阵列中误差检测和校正的装置和方法
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申请号： US11367081申请日： 2006-03-02
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公开(公告)号： US20060145722A1公开(公告)日： 2006-07-06
- 发明人: William Plants
- 申请人： William Plants
- 专利权人： Actel Corporation
- 当前专利权人： Actel Corporation
- 主分类号： H03K19/007
- IPC分类号： H03K19/007
摘要：
The present system comprises a radiation tolerant programmable logic device having logic modules and routing resources coupling together the logic modules. Configuration data lines providing configuration data control the programming of the logic modules and the routing resources. Error correction circuitry coupled to the configuration data lines analyzes and corrects any errors in the configuration data that may occur due to a single event upset (SEU).
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