发明申请
- 专利标题： Apparatus and method for capacitive measurement of materials
- 专利标题（中）： 材料电容测量的装置和方法
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申请号： US11328031申请日： 2006-01-09
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公开(公告)号： US20060152231A1公开(公告)日： 2006-07-13
- 发明人: Stefan Konermann , Markus Stein
- 申请人： Stefan Konermann , Markus Stein
- 申请人地址： DE Remscheid
- 专利权人： Plast-Control GmbH
- 当前专利权人： Plast-Control GmbH
- 当前专利权人地址： DE Remscheid
- 优先权： DE05000561.0 20050113
- 主分类号： G01R27/26
- IPC分类号： G01R27/26 ; G01N21/00
摘要：
Method for measuring thicknesses of a film, a foil or a material layer with a measuring head which is spaced away from the film and with which a capacitive thickness measurement is performed, in which an optical distance measurement is performed with a distance measuring device and a distance determined by the optical distance measurement is used in determining the film thickness in the capacitive thickness measurement.
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