发明申请
US20060154181A1 Method of forming resist pattern, positive resist composition, and layered product 有权
形成抗蚀剂图案的方法,正型抗蚀剂组合物和层状产品

  • 专利标题: Method of forming resist pattern, positive resist composition, and layered product
  • 专利标题(中): 形成抗蚀剂图案的方法,正型抗蚀剂组合物和层状产品
  • 申请号: US10535533
    申请日: 2003-12-01
  • 公开(公告)号: US20060154181A1
    公开(公告)日: 2006-07-13
  • 发明人: Hideo HadaMiwa MiyairiNaotaka KubotaTakeshi Iwai
  • 申请人: Hideo HadaMiwa MiyairiNaotaka KubotaTakeshi Iwai
  • 优先权: JP2002-350353 20021202
  • 国际申请: PCT/JP03/15347 WO 20031201
  • 主分类号: G03C5/00
  • IPC分类号: G03C5/00
Method of forming resist pattern, positive resist composition, and layered product
摘要:
There are provided a method of forming a resist pattern that enables the resist pattern to be formed with good control of the pattern size, as well as a positive resist composition used in the method, and a layered product formed using the positive resist composition. In the above method a positive resist composition comprising a resin component (A), which contains a structural unit (a1) derived from a (meth)acrylate ester represented by a general formula (I) shown below, and displays increased alkali solubility under action of acid, and an acid generator component (B) that generates acid on exposure is applied to a substrate, a prebake is conducted, the resist composition is selectively exposed, post exposure baking (PEB) is conducted, alkali developing is then used to form a resist pattern, and the pattern size of the thus produced resist pattern is then narrowed by heat treatment.
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