发明申请
- 专利标题： Method and probes for the detection of chromosome aberrations
- 专利标题（中）： 用于检测染色体畸变的方法和探针
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申请号： US11220718申请日： 2005-09-08
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公开(公告)号： US20060160106A1公开(公告)日： 2006-07-20
- 发明人: Jacobus Van Dongen , Karl-Johan Pluzek , Kirsten Nielsen , Kim Adelhorst
- 申请人： Jacobus Van Dongen , Karl-Johan Pluzek , Kirsten Nielsen , Kim Adelhorst
- 申请人地址： DK Glostrup
- 专利权人： Dako A/S
- 当前专利权人： Dako A/S
- 当前专利权人地址： DK Glostrup
- 优先权： DKDK199800615/98 19980504
- 主分类号： C12Q1/68
- IPC分类号： C12Q1/68
摘要：
A novel method for detecting chromosome aberrations is disclosed. More specifically, chromosome aberrations are detected by in situ hybridisation using at least two sets of hybridisation probes, at least one set comprising one or more peptide nucleic acid probes capable of hybridising to specific nucleic acid sequences related to a potential aberration in a chromosome, and at least one set comprising two or more peptide nucleic acid probes capable of hybridising to specific nucleic acid sequences related to another potential aberration in a chromosome. In particular, the method may be used for detecting chromosome aberrations in the form of breakpoints.
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