发明申请
US20060167579A1 Quality variation display device, quality variation display method, quality variation display program, and storage medium storing such program
有权
质量变化显示装置，质量变化显示方法，质量变化显示程序和存储该程序的存储介质
- 专利标题： Quality variation display device, quality variation display method, quality variation display program, and storage medium storing such program
- 专利标题（中）： 质量变化显示装置，质量变化显示方法，质量变化显示程序和存储该程序的存储介质
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申请号： US11311639申请日： 2005-12-20
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公开(公告)号： US20060167579A1公开(公告)日： 2006-07-27
- 发明人: Toru Fujii , Shiro Sugihara , Rusiko Bourtchouladze
- 申请人： Toru Fujii , Shiro Sugihara , Rusiko Bourtchouladze
- 专利权人： OMRON CORPORATION
- 当前专利权人： OMRON CORPORATION
- 优先权： JP2005-016,107 20050124; JP2005-096,381 20050329
- 主分类号： G06F19/00
- IPC分类号： G06F19/00
摘要：
A quality variation display device that can surely identify periodic information about quality on a product number basis such as the occurrence of a failure for every prescribed number of products is provided. The device includes a quality data storing database that stores the measurement result of each product measured by a measuring unit in association with the manufacturing order, an interval statistic calculation portion that shifts an interval corresponding to a prescribed number of products by a prescribed shift number of products, obtains a statistic for each of the intervals, and produces a graph representing the statistics in the manufacturing order at equal intervals, and a display portion that displays the graph.
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