发明申请
US20060175657A1 Advanced CMOS using super steep retrograde wells 有权
先进的CMOS使用超级陡逆流井

Advanced CMOS using super steep retrograde wells
摘要:
The present invention is a method for forming super steep doping profiles in MOS transistor structures. The method comprises forming a carbon containing layer (110) beneath the gate dielectric (50) and source and drain regions (80) of a MOS transistor. The carbon containing layer (110) will prevent the diffusion of dopants into the region (40) directly beneath the gate dielectric layer (50).
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