- 专利标题: Methods and apparatus for processing microfeature workpieces, e.g., for depositing materials on microfeature workpieces
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申请号: US11430328申请日: 2006-05-09
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公开(公告)号: US20060213440A1公开(公告)日: 2006-09-28
- 发明人: Lingyi Zheng , Trung Doan , Lyle Breiner , Er-Xuan Ping , Kevin Beaman , Ronald Weimer , David Kubista , Cem Basceri
- 申请人: Lingyi Zheng , Trung Doan , Lyle Breiner , Er-Xuan Ping , Kevin Beaman , Ronald Weimer , David Kubista , Cem Basceri
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 主分类号: C23C16/00
- IPC分类号: C23C16/00
摘要:
The present disclosure suggests several systems and methods for batch processing of microfeature workpieces, e.g., semiconductor wafers or the like. One exemplary implementation provides a method of depositing a reaction product on each of a batch of workpieces positioned in a process chamber in a spaced-apart relationship. A first gas may be delivered to an elongate first delivery conduit that includes a plurality of outlets spaced along a length of the conduit. A first gas flow may be directed by the outlets to flow into at least one of the process spaces between adjacent workpieces along a first vector that is transverse to the direction in which the workpieces are spaced. A second gas may be delivered to an elongate second delivery conduit that also has outlets spaced along its length. A second gas flow of the second gas may be directed by the outlets to flow into the process spaces along a second vector that is transverse to the first direction.
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