发明申请
- 专利标题: Deposition apparatus and deposition method
- 专利标题(中): 沉积设备和沉积方法
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申请号: US11377291申请日: 2006-03-17
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公开(公告)号: US20060213444A1公开(公告)日: 2006-09-28
- 发明人: Seiji Samukawa , Toshihisa Nozawa
- 申请人: Seiji Samukawa , Toshihisa Nozawa
- 申请人地址: JP Minato-ku JP Sendai-shi
- 专利权人: TOKYO ELECTRON LIMITED,SEIJI SAMUKAWA
- 当前专利权人: TOKYO ELECTRON LIMITED,SEIJI SAMUKAWA
- 当前专利权人地址: JP Minato-ku JP Sendai-shi
- 优先权: JP2003-325004 20030917
- 主分类号: C23C16/00
- IPC分类号: C23C16/00 ; H05H1/24 ; B05C11/00
摘要:
A deposition apparatus (10) comprises a plasma generation chamber (14) to which a pressure is applied with a treatment gas to generate plasma, a deposition chamber (20) in which a substrate is placed and a film is formed on the substrate, and a distribution plate (17) having a plurality of holes and provided between the plasma generation chamber (14) and the deposition chamber (20). A diameter of the hole in the distribution plate (17) has a size such that a pressure of the plasma generation chamber (14) is 2.0 times or more as high as that of the deposition chamber (20). The deposition apparatus (10) further comprises means for applying a predetermined bias voltage between the plasma generation chamber (14) and the deposition chamber (20).
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