发明申请
US20060219907A1 Charged particle beam apparatus, method of displaying sample image, and method of measuring image shift sensitivity 审中-公开
带电粒子束装置,显示样本图像的方法以及测量图像偏移灵敏度的方法

  • 专利标题: Charged particle beam apparatus, method of displaying sample image, and method of measuring image shift sensitivity
  • 专利标题(中): 带电粒子束装置,显示样本图像的方法以及测量图像偏移灵敏度的方法
  • 申请号: US11311425
    申请日: 2005-12-20
  • 公开(公告)号: US20060219907A1
    公开(公告)日: 2006-10-05
  • 发明人: Takeshi OgashiwaMitsugu SatoAtsushi Takane
  • 申请人: Takeshi OgashiwaMitsugu SatoAtsushi Takane
  • 优先权: JP2004-367222 20041220
  • 主分类号: G21K7/00
  • IPC分类号: G21K7/00 G01N23/00
Charged particle beam apparatus, method of displaying sample image, and method of measuring image shift sensitivity
摘要:
A sample image display method and an image shift sensitivity measuring method to be executed in a charged particle beam apparatus are provided for accurately correcting an image drift in any observing and analyzing condition such as an accelerating voltage, a working distance or a raster rotation. When obtaining a reference image used for detecting a drift, the process is executed to obtain an image having the different image shift amount from that of the reference image at a time and to occasionally measure an image shift sensitivity. Then, the process is executed to automatically register this reference image and the image shift sensitivity and to detect a drift amount and control an image shift (correct a drift) according to the registered conditions when correcting the drift.
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