发明申请
US20060240289A1 Magnetoresistive element and method of manufacturing same, magnetoresistive device, thin-film magnetic head, head gimbal assembly, head arm assembly and magnetic disk drive 有权
磁阻元件及其制造方法,磁阻器件,薄膜磁头,头万向架组件,头臂组件和磁盘驱动器

  • 专利标题: Magnetoresistive element and method of manufacturing same, magnetoresistive device, thin-film magnetic head, head gimbal assembly, head arm assembly and magnetic disk drive
  • 专利标题(中): 磁阻元件及其制造方法,磁阻器件,薄膜磁头,头万向架组件,头臂组件和磁盘驱动器
  • 申请号: US11391278
    申请日: 2006-03-29
  • 公开(公告)号: US20060240289A1
    公开(公告)日: 2006-10-26
  • 发明人: Tomohito MizunoDaisuke Miyauchi
  • 申请人: Tomohito MizunoDaisuke Miyauchi
  • 申请人地址: JP Tokyo
  • 专利权人: TDK Corporation
  • 当前专利权人: TDK Corporation
  • 当前专利权人地址: JP Tokyo
  • 优先权: JP2005-106999 20050404
  • 主分类号: G11B5/33
  • IPC分类号: G11B5/33 G11B5/127
Magnetoresistive element and method of manufacturing same, magnetoresistive device, thin-film magnetic head, head gimbal assembly, head arm assembly and magnetic disk drive
摘要:
A free layer of an MR element incorporates a first layer, a second layer, a third layer, a fourth layer, a fifth layer and a sixth layer that are stacked in this order on a nonmagnetic conductive layer. The absolute value of magnetostriction constant of the free layer is 1×10−6 or smaller. The coercivity of the free layer is 20×79.6 A/m or smaller. The first layer is made of an alloy containing ‘a’ atomic percent cobalt and (100−a) atomic percent iron wherein ‘a’ falls within a range of 20 to 50 inclusive. The second layer is made of an alloy containing ‘b’ atomic percent cobalt and (100−b) atomic percent iron wherein ‘b’ falls within a range of 70 to 90 inclusive. In addition, oxidation treatment is given to a surface of the second layer farther from the first layer.
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