发明申请
- 专利标题： Memory application tester having vertically-mounted motherboard
- 专利标题（中）： 内存应用测试仪具有垂直安装的主板
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申请号： US11295607申请日： 2005-12-07
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公开(公告)号： US20060242468A1公开(公告)日： 2006-10-26
- 发明人: Jong Kang
- 申请人： Jong Kang
- 专利权人： UniTest Incorporation
- 当前专利权人： UniTest Incorporation
- 优先权： KR10-2005-0032726 20050420
- 主分类号： G06F11/00
- IPC分类号： G06F11/00
摘要：
The present invention relates to a memory application tester for testing a semiconductor memory device comprising a plurality of motherboards having a memory socket. The motherboards are vertically mounted and effectively integrated so that a memory application tester may test more memory device simultaneously, and a limit in the trace length due to the integration of the motherboards is effectively solved.