发明申请
- 专利标题: Modular gantry system for x-ray inspection
- 专利标题(中): 用于X射线检测的模块化龙门架系统
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申请号: US11370249申请日: 2006-03-07
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公开(公告)号: US20060251211A1公开(公告)日: 2006-11-09
- 发明人: Lee Grodzins , Peter Rothschild , Louis Perich , David Montion , David Hotham
- 申请人: Lee Grodzins , Peter Rothschild , Louis Perich , David Montion , David Hotham
- 主分类号: G01N23/04
- IPC分类号: G01N23/04
摘要:
A system for inspecting an enclosure. A source generates a beam of penetrating radiation that is characterized, at each instant of time, by a power spectrum of intensity as a function of energy. A first module conveys the source along the length of the enclosure while a detector, coupled so as to move in coordination with the first module, detects the beam of penetrating radiation after the beam interacts with the object and generating a detector signal. A beam shaper modifies the instantaneous power spectrum of the beam of penetrating radiation. The first module and the detector may be coupled by a gantry straddling the enclosure. Other modules may be coupled to move with the first module.
公开/授权文献
- US2584601A Alphabet- and numeral-teaching guide 公开/授权日:1952-02-05
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