In a method and system for protecting a semiconductor device from an electrostatic discharge (ESD) event, an ESD tester generates an ESD event by providing an ESD test signal having a leading pulse and a trailing pulse. An ESD input of the device under test (DUT) receives the ESD test signal. An ESD protection circuit embedded in the DUT detects the ESD signal and asserts a trigger in response to the detection. The ESD protection circuit provides a leading discharge path to the leading pulse in response to detecting the ESD signal, thereby protecting the DUT during the leading pulse. In addition, the ESD protection circuit also provides a trailing discharge path to the trailing pulse in response to the trigger, thereby protecting the DUT during the trailing pulse.