发明申请
US20060268636A1 Semiconductor device and entry into test mode without use of unnecessary terminal
有权
半导体器件进入测试模式，不使用不必要的端子
- 专利标题： Semiconductor device and entry into test mode without use of unnecessary terminal
- 专利标题（中）： 半导体器件进入测试模式，不使用不必要的端子
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申请号： US11207935申请日： 2005-08-22
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公开(公告)号： US20060268636A1公开(公告)日： 2006-11-30
- 发明人: Yoshiaki Nagatomi , Kenichi Kawabata , Norihiro Nakatsuhama , Tetsuya Yoshida , Naoya Watanabe , Tomohiro Wada , Tomohide Yamamoto
- 申请人： Yoshiaki Nagatomi , Kenichi Kawabata , Norihiro Nakatsuhama , Tetsuya Yoshida , Naoya Watanabe , Tomohiro Wada , Tomohide Yamamoto
- 专利权人： FUJITSU LIMITED
- 当前专利权人： FUJITSU LIMITED
- 优先权： JP2005-156035 20050527
- 主分类号： G11C29/00
- IPC分类号： G11C29/00
摘要：
A semiconductor device includes a first power supply terminal, a second power supply terminal, a comparison circuit coupled to the first power supply terminal and the second power supply terminal to produce at an output node thereof a signal responsive to a difference between a potential of the first power supply terminal and a potential of the second power supply terminal, and a core circuit coupled to the output node of the comparison circuit to perform a test operation in response to the signal.
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